Patent · US Active

Persistent command parameter table for pre-silicon device testing

US10289512B2 · kind B2 · utility

1Cited by

20References

1Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Dean G. Bair · Bloomington, US
Rebecca M. Gott · Poughkeepsie, US
Edward J. Kaminski, Jr. · Lansdowne, US
William J. Lewis · Poughkeepsie, US
Chakrapani Rayadurgam · Savanuru, IN

Key dates

Filing date	Oct 4, 2017
Grant date	May 14, 2019
Priority date	—
Expiry date	Oct 4, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/54
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.