Thermally stable charge trapping layer for use in manufacture of semiconductor-on-insulator structures
US10290533B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 11, 2016 |
| Grant date | May 14, 2019 |
| Priority date | — |
| Expiry date | Apr 14, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/201
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A single crystal semiconductor handle substrate for use in the manufacture of semiconductor-on-insulator (e.g., silicon-on-insulator (SOI)) structure is etched to form a porous layer in the front surface region of the wafer. The etched region is oxidized and then filled with a semiconductor material, which may be polycrystalline or amorphous. The surface is polished to render it bondable to a semiconductor donor substrate. Layer transfer is performed over the polished surface thus creating semiconductor-on-insulator (e.g., silicon-on-insulator (SOI)) structure having 4 layers: the handle substrate, the composite layer comprising filled pores, a dielectric layer (e.g., buried oxide), and a device layer. The structure can be used as initial substrate in fabricating radiofrequency chips. The resulting chips have suppressed parasitic effects, particularly, no induced conductive channel below the buried oxide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.