Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
US10295484B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Apr 5, 2017 |
| Grant date | May 21, 2019 |
| Priority date | — |
| Expiry date | Jan 5, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/62
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for performing an X-ray diffraction measurement with a diffractometer having an X-ray beam directed at a sample and a two-dimensional X-ray detector includes the performance of a physical scan during which the detector is moved through a scanning range in an angular direction about the sample position. To provide a uniform exposure time, the detector, when located at an extreme of the scanning range, is controlled to progressively change the portion of the detected X-ray energy that is used at a rate that maintains a uniform exposure time for each angular position in the scanning range. Alternatively, when located at an extreme of the range, the detector is kept stationary until a desired minimum exposure time is obtained for each angular position, after which the collected diffraction data is normalized relative to exposure time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.