Bob Baoping He
21Patents
9h-index
16Co-inventors
72Inventor score
Filing activity: Jan 28, 1999 → Jul 27, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6163592A | Beam scattering measurement system with transmitted beam energy detection | Physics | 21 | Expired |
| US7317784B2 | Multiple wavelength X-ray source | Electricity | 21 | Expired |
| US6718008B1 | X-ray diffraction screening system with retractable x-ray shield | Physics | 19 | Expired |
| US7242745B2 | X-ray diffraction screening system convertible between reflection and transmission modes | Physics | 18 | Expired |
| US6859520B2 | Transmission mode X-ray diffraction screening system | Physics | 17 | Expired |
| US7269245B2 | Combinatorial screening system and X-ray diffraction and Raman spectroscopy | Performing Operations; Transporting | 14 | Expired |
| US6836532B2 | Diffraction system for biological crystal screening | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6701743B1 | Non-spilling cryogenic transfer vial for crystal sample mounting | Mechanical Engineering; Lighting; Heating | 11 | Expired |
| US7848489B1 | X-ray diffractometer having co-exiting stages optimized for single crystal and bulk diffraction | Physics | 10 | Active |
| US6956928B2 | Vertical small angle x-ray scattering system | Physics | 7 | Expired |
| US7646847B2 | Handheld two-dimensional X-ray diffractometer | Physics | 5 | Active |
| US7403593B1 | Hybrid x-ray mirrors | Physics | 4 | Active |
| US7885383B1 | Method for measuring crystallite size with a two-dimensional X-ray diffractometer | Physics | 4 | Active |
| US7190762B2 | Scanning line detector for two-dimensional x-ray diffractometer | Physics | 3 | Expired |
| US8548123B2 | Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer | Physics | 3 | Active |
| US9897559B2 | Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector | Physics | 2 | Active |
| US7248672B2 | Multiple-position x-ray tube for diffractometer | Electricity | 2 | Expired |
| US10416102B2 | X-ray diffraction device and method to measure stress with 2D detector and single sample tilt | Physics | 2 | Active |
| US10295484B2 | Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector | Physics | 1 | Active |
| US11397154B2 | Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction | Physics | 1 | Active |
| US10444169B2 | Two-dimensional X-ray detector position calibration and correction with diffraction pattern | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.