Method and device for the contact-free measurement of surface contours

US10302421B2 · kind B2 · utility

Assignee

• Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

• Stefan Heist · Jena, DE
• Peter Kühmstedt · Jena, DE
• Gunther Notni · Jena, DE

Key dates

• Filing date: Aug 13, 2014
• Grant date: May 28, 2019
• Expiry date: Oct 1, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G03B37/04
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Method and device for non-contact measuring of surface contours. A sequence of stripe patterns, formed from a plurality of stripes of equal stripe direction are projected on a surface to be measured, wherein the stripe patterns are each aperiodic and have a sinusoidal brightness distribution and wherein, during the projecting of each of the stripe patterns, at least one image of the surface is captured by at least one camera. By the stripe pattern projected on the surface, corresponding points in the image planes of a camera and of a projection device used for projecting, or in the image planes of the cameras, are then identified by maximizing a correlation between sequences of brightness values recorded for each of the points, whereupon spatial coordinates of surface points on the surface are determined via triangulation on the basis of points identified as corresponding.