Inventor · Jena, DE

Stefan Heist

2Patents
1h-index
5Co-inventors
30Inventor score

Filing activity: Aug 13, 2014 → May 4, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US10302421B2 Method and device for the contact-free measurement of surface contours Physics 2 Active
US10378888B2 Device and method for spatially measuring surfaces Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.