Patent · US Active

Topography prediction using system state information

US10303812B2 · kind B2 · utility

0Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 8, 2016
Grant dateMay 28, 2019
Priority date
Expiry dateMar 30, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2111/08
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments presented herein provide techniques for predicting the topography of a product produced from a manufacturing process. One embodiment includes generating a plurality of prediction models. Each of the plurality of prediction models corresponds to a respective one of a plurality of positional coordinates of a product produced from a manufacturing process. The method also includes receiving a set of user-specified input parameters to apply to the manufacturing control process. The method further includes generating a graphical representation of a topography map for the product for the user-specified of input parameters based on the plurality of prediction models.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.