Patent · US Active

Programmable logic integrated circuit, semiconductor device, and characterization method

US10305485B2 · kind B2 · utility

0Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 31, 2016
Grant dateMay 28, 2019
Priority date
Expiry dateAug 31, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K5/1508
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

An object of the present invention is to provide a method for effectively performing characterization for circuit verification by static timing analysis, of a programmable logic integrated circuit including a crossbar switch including a resistance-variable element, and a logic circuit logically configured with the crossbar switch, wherein: the programmable logic integrated circuit is divided into a plurality of leaf cells including a plurality of load circuits including a part of the crossbar switch, and a power supply element input to the crossbar switch; the leaf cell is divided into delay paths each including a base leaf cell and a correction leaf cell; and circuit verification is performed based on a delay information library in which a delay time for the base leaf cell and a correction delay for the correction leaf cell are integrated into a delay time for the leaf cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.