Patent · US Active

Turret handler for testing electronic elements with leads

US10310011B2 · kind B2 · utility

0Cited by
5References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 1, 2017
Grant dateJun 4, 2019
Priority date—
Expiry dateOct 6, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2887
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A turret handler is provided. The turret handler is adapted to test an electronic element. The electronic element includes an element body and a plurality of leads. The turret handler includes a nozzle, a stage, a test block, and an abutting unit. The nozzle is adapted to hold the element body to move the electronic element. The test block is disposed on the stage. The nozzle moves the electronic element to the test block. The test block includes a coupling unit and an initiative portion. The coupling unit includes a coupling portion, a pressing portion, and an elastic structure. The elastic structure is connected to the pressing portion. The initiative portion is connected to the elastic structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.