Patent · US Active

Method and apparatus for providing clock signals for a scan chain

US10310015B2 · kind B2 · utility

1Cited by

7References

22Claims

0Family size

Assignee

Advanced Micro Devices, Inc. · US

Inventors

Thomas Clouqueur · Boxborough, US
Dwight K. Elvey · Sunnyvale, US
Kamran Zarrineh · Vestal, US

Key dates

Filing date	Jul 19, 2013
Grant date	Jun 4, 2019
Priority date	—
Expiry date	May 21, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318541
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An integrated circuit device includes a plurality of flip flops configured into a scan chain. The plurality of flip flops includes at least flip flop of a first type and at least one flip flop of a second type. A method includes generating a first scan clock signal for loading scan data into at least one flip flop of a first type, generating a second scan clock signal and a third scan clock signal for loading the scan data into at least one flip flop of a second type, and loading a test pattern into a scan chain defined by the at least flip flop of the first type and the at least one flip flop of the second type responsive to the first, second, and third scan clock signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.