Advanced Micro Devices, Inc.
🏢 View company profile →12,957Patents
3,762Active
12,957Granted
56Portfolio score
Filing activity: Apr 23, 1975 → Jun 28, 2024 · 884 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6646307B1 | MOSFET having a double gate | Electricity | 1,438 | Expired |
| US5969422A | Plated copper interconnect structure | Electricity | 625 | Expired |
| US7505795B1 | Power save management with customized range for user configuration and tuning value based upon recent usage | Emerging Cross-Sectional Technologies | 611 | Expired |
| US6475869B1 | Method of forming a double gate transistor having an epitaxial silicon/germanium channel region | Electricity | 577 | Expired |
| US6972478B1 | Integrated circuit and method for its manufacture | Electricity | 575 | Expired |
| US6682973B1 | Formation of well-controlled thin SiO, SiN, SiON layer for multilayer high-K dielectric applications | Electricity | 547 | Expired |
| US6706571B1 | Method for forming multiple structures in a semiconductor device | Electricity | 543 | Expired |
| US6688784B1 | Parallel plate development with multiple holes in top plate for control of developer flow and pressure | Emerging Cross-Sectional Technologies | 538 | Expired |
| US7071051B1 | Method for forming a thin, high quality buffer layer in a field effect transistor and related structure | Electricity | 531 | Expired |
| US6943067B2 | Three-dimensional integrated semiconductor devices | Electricity | 520 | Expired |
| US6716571B2 | Selective photoresist hardening to facilitate lateral trimming | Emerging Cross-Sectional Technologies | 515 | Expired |
| US7550396B2 | Method for reducing resist poisoning during patterning of silicon nitride layers in a semiconductor device | Electricity | 489 | Active |
| US5663899A | Redundant thermocouple | Physics | 474 | Expired |
| US6731542B1 | Circuit for accurate memory read operations | Physics | 460 | Expired |
| US6819612B1 | Apparatus and method for a sense amplifier circuit that samples and holds a reference voltage | Physics | 452 | Expired |
| US6308255A | Symmetrical multiprocessing bus and chipset used for coprocessor support allowing non-native code to run in a system | Physics | 442 | Expired |
| US7084758B1 | Location-based reminders | Electricity | 419 | Expired |
| US6768679B1 | Selection circuit for accurate memory read operations | Physics | 417 | Expired |
| US5915084A | Scannable sense amplifier circuit | Electricity | 411 | Expired |
| US4990462A | Method for coplanar integration of semiconductor ic devices | Emerging Cross-Sectional Technologies | 402 | Expired |
| US6296710A | Multi-port gas injector for a vertical furnace used in semiconductor processing | Chemistry; Metallurgy | 400 | Expired |
| US6528409B1 | Interconnect structure formed in porous dielectric material with minimized degradation and electromigration | Electricity | 394 | Expired |
| US6746308B1 | Dynamic lot allocation based upon wafer state characteristics, and system for accomplishing same | Electricity | 392 | Expired |
| US5913147A | Method for fabricating copper-aluminum metallization | Electricity | 385 | Expired |
| US6955928B1 | Closed loop residual gas analyzer process control technique | Electricity | 383 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.