Patent · US Active

Test case generation

US10318667B2 · kind B2 · utility

1Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2015
Grant dateJun 11, 2019
Priority date
Expiry dateDec 16, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the present invention provide methods, computer program products, and systems for generating comprehensive test cases covering new events yet to be covered. Embodiments of the present invention can be used to receive a request to generate a test case, wherein the request comprises a coverage schema associated with a first set of events to be covered in the generated test case. Embodiments of the present invention can update the coverage schema, wherein updating the coverage schema comprises adding a second set of events to be covered in the generated test case and generate constraints used to satisfy requirements for meeting the first and the second set of events in the updated coverage schema. Embodiments of the present invention can generate a test case using the generated constraints and the updated schema.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.