Optical configuration for measurement device using emitter material configuration
US10323928B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 16, 2017 |
| Grant date | Jun 18, 2019 |
| Priority date | — |
| Expiry date | Jan 2, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning probe responsive in three axes is provided for use in a coordinate measuring machine. The scanning probe includes a frame, a stylus suspension portion and a stylus position detection portion. The stylus position detection portion includes a light source that is operated to radiate source light toward a position indicating element that is fixed relative to the stylus coupling portion. The position indicating element includes a position indicating emitter having an emitter material (e.g., phosphor) that inputs and absorbs the light from the light source and responds by outputting excitation light. In various implementations, the excitation light is directed as at least one of axial measurement light along an axial measurement spot path to form an axial measurement spot on an axial position sensitive detector and/or rotary measurement light along a rotary measurement spot path to form a rotary measurement spot on a rotary position sensitive detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.