Mitutoyo Corporation
1,640Patents
1,168Active
1,640Granted
60Portfolio score
Filing activity: Apr 17, 1987 → Apr 29, 2024 · 250 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7043852B2 | Measuring instrument | Physics | 1,364 | Expired |
| US5187874A | Coordinate measuring machine with protected origin point blocks | Physics | 178 | Expired |
| US5204824A | Method of and apparatus for copy controlling coordinate measuring probe with rotary table | Physics | 137 | Expired |
| US7626705B2 | Chromatic sensor lens configuration | Physics | 130 | Active |
| US7130320B2 | External cavity laser with rotary tuning element | Electricity | 117 | Expired |
| US6011389A | Induced current position transducer having a low power electronic circuit | Physics | 110 | Expired |
| US6334699B1 | Systems and methods for diffuse illumination | Mechanical Engineering; Lighting; Heating | 101 | Expired |
| US8895911B2 | Optical encoder with misalignment detection and adjustment method associated therewith | Physics | 98 | Active |
| US5886519A | Multi-scale induced current absolute position transducer | Physics | 91 | Expired |
| US6542180B1 | Systems and methods for adjusting lighting of a part based on a plurality of selected regions of an image of the part | Electricity | 90 | Expired |
| US5467289A | Method of and an apparatus for measuring surface contour | Physics | 90 | Expired |
| US7454053B2 | System and method for automatically recovering video tools in a vision system | Physics | 90 | Active |
| US5410410A | Non-contact type measuring device for measuring three-dimensional shape using optical probe | Physics | 89 | Expired |
| US4879508A | Capacitance-type measuring device for absolute measurement of positions | Physics | 88 | Expired |
| US7030351B2 | Systems and methods for rapidly automatically focusing a machine vision inspection system | Electricity | 86 | Expired |
| US4878013A | Capacitive type measurement transducer with improved electrode arrangement | Physics | 83 | Expired |
| US5757496A | Method of surface roughness measurement using a fiber-optic probe | Physics | 82 | Expired |
| US5053715A | Capacitance-type measuring device for absolute measurement of positions | Physics | 81 | Expired |
| US5973494A | Electronic caliper using a self-contained, low power inductive position transducer | Physics | 76 | Expired |
| US7324682B2 | System and method for excluding extraneous features from inspection operations performed by a machine vision inspection system | Physics | 75 | Expired |
| US5841274A | Induced current absolute position transducer using a code-track-type scale and read head | Physics | 74 | Expired |
| US5104225A | Position detector and method of measuring position | Physics | 73 | Expired |
| US5894678A | Electronic linear tape measure using a low power induced current position transducer | Physics | 72 | Expired |
| US6621065B1 | Imaging probe | Electricity | 72 | Expired |
| US8055466B2 | Global calibration for stereo vision probe | Physics | 72 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.