Ion-sensitive structure and method for producing the same
US10365244B2 · kind B2 · utility
0Cited by
3References
23Claims
0Family size
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Key dates
| Filing date | Mar 18, 2016 |
| Grant date | Jul 30, 2019 |
| Priority date | — |
| Expiry date | Mar 18, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/414
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ion-sensitive structure includes a semiconductor structure and a layer stack disposed on the semiconductor structure having a doped intermediate layer including a doping material and a first metal oxide material. The semiconductor structure is configured to change an electric characteristic based on a contact of the ion-sensitive structure with an electrolyte including ions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.