Patent · US Active

Control method of profile measuring apparatus

US10365630B2 · kind B2 · utility

1Cited by

6References

6Claims

0Family size

Assignee

Mitutoyo Corporation · JP

Inventors

Takashi Noda · Kaminokawa, JP
Hiromi Deguchi · Fujinomiya, JP
Norihiko Murata · Yokohama, JP

Key dates

Filing date	Jun 30, 2017
Grant date	Jul 30, 2019
Priority date	—
Expiry date	Nov 11, 2037

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY02P90/02
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe displacement command in a scanning measurement is generated according to a composite speed vector V: V=Gf·Vf+Ge·Ve+sp(p)·Gc·Vc2

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.