Device and method for spatially measuring surfaces

US10378888B2 · kind B2 · utility

Assignees

• Friedrich-Schiller-Universitat Jena · DE
• Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

• Stefan Heist · Jena, DE
• Gunther Notni · Jena, DE
• Kevin Srokos · Weimar, DE
• Peter Lutzke · Jena, DE
• Ingo Schmidt · Schwarzenbek, DE
• Peter Kühmstedt · Jena, DE

Key dates

• Filing date: May 4, 2016
• Grant date: Aug 13, 2019
• Expiry date: May 4, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B11/254
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A device, for spatially measuring surfaces, includes a projector for projecting patterns into an object space, two cameras for recording pictures of a surface in the object space, and a control and evaluation unit for activating the cameras and evaluating the pictures. The projector includes a light source, a projection lens, at least one rotatably arranged pattern structure, and a drive for rotating the at least one pattern structure. The control and evaluation unit to: activate the cameras for simultaneously recording a picture at each of a plurality of successive points in time; identify corresponding points in the picture planes of the cameras, by way of evaluating a correlation function between the sequences of brightness values acquired for potentially corresponding points and maximizing a value of the correlation; and determine spatial coordinates of surface points by way of triangulation on the basis of the identified corresponding points.