Sample collection device and manufacturing method thereof
US10379075B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2016 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | May 27, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample collection device includes two substrates and a spacer. The two substrates are disposed oppositely. Each substrate has a first surface, a second surface opposing to the first surface, a first recess and at least one second recess. The two substrates are arranged with the first surfaces facing each other, and the first and second recesses are respectively located on each first surface. The first recesses of the substrates jointly form a first channel, and the second recesses of the substrates jointly form a second channel connected to the outside of the sample collection device. The first channel and the second channel are interconnected. The spacer is disposed between the two first surfaces for bonding and fixing the two substrates. A sample containing space is formed between the two substrates and the spacer. The sample containing space includes the first chancel and the second channel. In addition, a manufacturing method of the sample collection device is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.