Patent · US Active

Method for controlling shape measuring apparatus

US10379520B2 · kind B2 · utility

1Cited by

1References

3Claims

0Family size

Assignee

Mitutoyo Corporation · JP

Inventors

Takashi Noda · Kaminokawa, JP
Hiromi Deguchi · Fujinomiya, JP
Norihiko Murata · Yokohama, JP

Key dates

Filing date	Sep 21, 2016
Grant date	Aug 13, 2019
Priority date	—
Expiry date	Oct 11, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG05B2219/23385
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

There is provided a method for controlling a shape measuring apparatus which can achieve both trajectory correcting capability and control stability. A stylus tip is moved along a scanning path while controlling the stylus tip so as to keep an amount of deflection of a probe to a workpiece to be a reference amount of deflection. A movement instruction for the probe is generated according to a combined velocity vector V represented by the following expression: combined velocity vector V=Gf·Vf+Ge·Ve+Gc·Vc2,

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.