Patent · US Active

Control gate dummy for word line uniformity and method for producing the same

US10381360B1 · kind B1 · utility

1Cited by
1References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 22, 2018
Grant dateAug 13, 2019
Priority date
Expiry dateMar 22, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6892
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a uniform WL over the MCEL region and resulting device are provided. Embodiments include providing a substrate having a MCEL region, a HV region and a logic region, separated by an isolation region; forming a plurality of CG stacks over the MCEL region, and a plurality of CG dummy stacks over the HV region and the logic region, respectively; forming first and second overlying polysilicon layers with a spacer therebetween, an EG and a WL on the MCEL region formed; planarizing the second polysilicon layer down to upper surface of the plurality of CG stacks and the plurality of CG dummy stacks; and removing portions of the second polysilicon layer in-between the plurality of CG stacks and around the plurality of CG dummy stacks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.