Two frequency time-of-flight three-dimensional image sensor and method of measuring object depth
US10382736B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 9, 2018 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | Feb 9, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2013/0081
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A three-dimensional image system includes a modulator configured to generate a first and a second modulation signal having a predetermined frequency difference, an illumination source configured to generate a light signal modulated by the first modulation signal, and a pixel array modulated by the second modulation signal. At least one pixel of the pixel array is configured to receive a reflected modulated light signal and generate a plurality of measurement signals based on a plurality of image acquisitions taken at different acquisition times. A controller is configured to control a phase difference between the first modulation signal and the second modulation signal by setting the first modulation frequency and the second modulation frequency to have a predetermined frequency difference greater than zero; and calculate a depth of the object based on the plurality of measurement signals, the depth being a distance from the 3DI system to the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.