Dual-guard imager probe
US10386527B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2015 |
| Grant date | Aug 20, 2019 |
| Priority date | — |
| Expiry date | Jul 8, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure introduces an apparatus for downhole measurement of a formation resistivity. The apparatus includes a probe having a button electrode, a first guard electrode insulated from the button electrode, a second guard electrode insulated from the first guard electrode, and a return electrode positioned external to the second guard electrode. The apparatus also includes an electrical source for setting a voltage drop between the second guard electrode and the return electrode, a first impedance (RBOG) electrically coupled between the button electrode and the second guard electrode, and a second impedance (RIGOG) electrically coupled between the first guard electrode and the second guard electrode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.