Sofiane Ellouz
3Patents
1h-index
5Co-inventors
37Inventor score
Filing activity: Sep 25, 2006 → Nov 23, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10386527B2 | Dual-guard imager probe | Physics | 1 | Active |
| US8207727B2 | RF circuit analysis | Physics | 0 | Active |
| US8173448B2 | Wafer with scribe lanes comprising external pads and/or active circuits for die testing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.