Method and apparatus for repairing memory device
US10395749B2 · kind B2 · utility
2Cited by
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15Claims
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Key dates
| Filing date | Sep 8, 2017 |
| Grant date | Aug 27, 2019 |
| Priority date | — |
| Expiry date | Feb 16, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of repairing a memory device may include collecting fail information on fail cells in a multi-block memory, classifying the fail cells into first and second types, and repairing the fail cells in the multi-block memory using one or more of a global spare memory, a local spare memory, and a common spare memory, based on the fail information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.