Calibration of measurement probes
US10401162B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 2015 |
| Grant date | Sep 3, 2019 |
| Priority date | — |
| Expiry date | Nov 27, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A machine tool is provided with a toolsetting probe mounted on a bed or table, and a workpiece-sensing probe which can be mounted in a movable spindle. Both probes are calibrated by using them to make measurements against each other. The arbitrary length of the workpiece-sensing probe is used to calibrate the toolsetting probe, rather than using a pre-calibrated artefact of known length mounted in the spindle. A stylus disc of the toolsetting probe has a pre-calibrated size or dimension, and the workpiece-sensing probe is calibrated with respect to that. This obviates the need for skilful manual calibration procedures using pre-calibrated artefacts and manual measurement tools.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.