Patent · US Active

Quality inspection system and method of operation

US10408606B1 · kind B1 · utility

19Cited by
4References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 24, 2018
Grant dateSep 10, 2019
Priority date
Expiry dateSep 24, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30248
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An inspection system for measuring an object is provided. The inspection system includes an entryway sized to receive the object. At least two non-contact coordinate measurement devices are positioned with a field of view being at least partially within or adjacent to the entryway, each of the at least two non-contact coordinate measurement devices being operable to measure 3D coordinates for a plurality of points on the object as one of the object or the entryway move from a first position to a final position. A pose measurement device is operable to determine the six-degree of freedom (6DOF) pose of the object. One or more processors are provided that register the 3D coordinates for the plurality of points from each of the at least two non-contact coordinate measurement devices based at least in part on the 6DOF pose of the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.