Steffen Kappes
6Patents
2h-index
16Co-inventors
37Inventor score
Filing activity: Sep 24, 2018 → Aug 6, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10408606B1 | Quality inspection system and method of operation | Physics | 19 | Active |
| US10663292B2 | Quality inspection system and method of operation | Physics | 2 | Active |
| US11592285B2 | Modular inspection system for measuring an object | Physics | 0 | Active |
| US10935365B2 | Mounting arrangement for 3D sensor | Physics | 0 | Active |
| US12115652B2 | Referencing pose manipulation system for marker based tracking of position measurement system | Physics | 0 | Active |
| US12000689B2 | Environmental scanning and image reconstruction thereof | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.