Testing system, method for testing an integrated circuit and a circuit board including the same
US10408875B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2016 |
| Grant date | Sep 10, 2019 |
| Priority date | — |
| Expiry date | May 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31715
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system includes a subtractor and a divider. The subtractor is configured to receive a first voltage of a circuit being tested and a second voltage of the circuit, and to derive a difference between the first voltage and the second voltage. The divider is configured to receive the difference between the first voltage and the second voltage, and to derive a resistance of the circuit by dividing (i) the difference between the first voltage and the second voltage by (ii) a difference between a first current applied to the circuit and a second current applied to the circuit. The first voltage is corresponding to the first current, and the second voltage is corresponding to the second current.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.