Patent · US Active

Encapsulated nanostructures and devices containing encapsulated nanostructures

US10411096B2 · kind B2 · utility

1Cited by
10References
17Claims
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Key dates

Filing dateApr 30, 2018
Grant dateSep 10, 2019
Priority date
Expiry dateApr 30, 2038

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y10/00
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Various nanostructures, including silicon nanowires and encapsulated silicon nanoislands, and methods of making the nanostructures are provided. The methods can include providing a fin structure extending above a substrate, wherein the fin structure has at least one silicon layer and at least two silicon:germanium alloy (SiGe) layers that define sidewalls of the fin structure; and annealing the fin structure in oxygen to form a silicon nanowire assembly. The silicon nanowire assembly can include a silicon nanowire, a SiGe matrix surrounding the silicon nanowire; and a silicon oxide layer disposed on the SiGe matrix. The annealing can be, for example, at a temperature between 800° C. and 1000° C. for five minutes to sixty minutes. The silicon nanowire can have a long axis extending along the fin axis, with perpendicular first and second dimensions extending less than 50 nm along directions perpendicular to the fin axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.