Method of performing X-ray spectroscopy and X-ray absorption spectrometer system

US10416099B2 · kind B2 · utility

Assignee

• Sigray, Inc. · US

Inventors

• Wenbing Yun · Walnut Creek, US
• Srivatsan Seshadri · San Ramon, US
• Sylvia Jia Yun Lewis · San Francisco, US
• Janos Kirz · Berkeley, US
• Alan Francis Lyon · Berkeley, US
• Benjamin Donald Stripe · Berkeley, US

Key dates

• Filing date: Mar 21, 2018
• Grant date: Sep 17, 2019
• Expiry date: Mar 21, 2038

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01J2235/1291
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.