Patent assignee · US · COMPANY

Sigray, Inc.

49Patents
49Active
49Granted
60Portfolio score

Filing activity: Sep 19, 2014 → Feb 13, 2025

Most-cited patents

PatentTitleAreaCited byStatus
US9594036B2 X-ray surface analysis and measurement apparatus Electricity 63 Active
US9823203B2 X-ray surface analysis and measurement apparatus Electricity 57 Active
US9448190B2 High brightness X-ray absorption spectroscopy system Electricity 53 Active
US9719947B2 X-ray interferometric imaging system Electricity 49 Active
US9874531B2 X-ray method for the measurement, characterization, and analysis of periodic structures Electricity 48 Active
US9570265B1 X-ray fluorescence system with high flux and high flux density Electricity 45 Active
US9449781B2 X-ray illuminators with high flux and high flux density Electricity 39 Active
US9390881B2 X-ray sources using linear accumulation Electricity 37 Active
US10295485B2 X-ray transmission spectrometer system Electricity 36 Active
US10349908B2 X-ray interferometric imaging system Physics 33 Active
US9543109B2 X-ray sources using linear accumulation Electricity 32 Active
US10247683B2 Material measurement techniques using multiple X-ray micro-beams Physics 32 Active
US10416099B2 Method of performing X-ray spectroscopy and X-ray absorption spectrometer system Electricity 31 Active
US10401309B2 X-ray techniques using structured illumination Electricity 27 Active
US10352880B2 Method and apparatus for x-ray microscopy Electricity 26 Active
US10304580B2 Talbot X-ray microscope Physics 25 Active
US10653376B2 X-ray imaging system Physics 21 Active
US10466185B2 X-ray interrogation system using multiple x-ray beams Physics 20 Active
US10578566B2 X-ray emission spectrometer system Physics 20 Active
US10269528B2 Diverging X-ray sources using linear accumulation Electricity 19 Active
US10297359B2 X-ray illumination system with multiple target microstructures Electricity 19 Active
US10295486B2 Detector for X-rays with high spatial and high spectral resolution Physics 18 Active
US10962491B2 System and method for x-ray fluorescence with filtering Physics 15 Active
US11215572B2 System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements Physics 13 Active
US11175243B1 X-ray dark-field in-line inspection for semiconductor samples Electricity 11 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.