Patent · US Active

Power and scan resource reduction in integrated circuit designs having shift registers

US10417363B1 · kind B1 · utility

3Cited by
26References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 2016
Grant dateSep 17, 2019
Priority date
Expiry dateMar 23, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/27
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments relate to methodologies for applying multibit cell merging to functional shift registers, thereby saving area, reducing scan-wirelength, saving power and reducing wiring congestion in integrated circuit designs. In embodiments, during synthesis, shift registers in a design are identified. In these and other embodiments, in identified shift registers, functional shift register flip-flops are merged into non-scan multi-bit flip-flops using a physically aware approach.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.