Method and system for utilizing stand-alone controller in multiplexed handler test cell for indexless tandem semiconductor test
US10422828B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 29, 2012 |
| Grant date | Sep 24, 2019 |
| Priority date | — |
| Expiry date | Jul 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method utilize a stand-alone controller for a multiplexed handler test cell in automated and robotic semiconductor test equipment for indexless tandem semiconductor testing. The stand-alone controller is configured such that functions relating to both the handler drivers and the data post-processor of the multiplexed handler tested cell are included within the stand-alone controller. The system and method also include provisions for using a virtual multiplexed handler test cell in a preliminary stage prior to actual implementation of the actual multiplexed handler test cell. This configuration permits the stand-alone controller to control the functions of the multiplexed handlers and to coordinate their activity with the tester.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.