CELERINT, LLC
15Patents
15Active
15Granted
50Portfolio score
Filing activity: Aug 20, 2009 → Jun 5, 2024 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8400180B2 | Tandem handler system and method for reduced index time | Physics | 6 | Active |
| US9817062B2 | Parallel concurrent test system and method | Physics | 4 | Active |
| US11555856B2 | Method for in situ functionality testing of switches and contacts in semiconductor interface hardware | Physics | 3 | Active |
| US10043722B2 | Method for testing semiconductor wafers using temporary sacrificial bond pads | Electricity | 1 | Active |
| US12025663B2 | Method for semiconductor device interface circuitry functionality and compliance testing | Physics | 1 | Active |
| US9551740B2 | Parallel concurrent test system and method | Physics | 1 | Active |
| US9818631B2 | Semiconductor device handler throughput optimization | Emerging Cross-Sectional Technologies | 1 | Active |
| US12061231B2 | Device interface board compliance testing using impedance response profiling | Electricity | 0 | Active |
| US9733301B2 | Universal multiplexing interface system and method | Physics | 0 | Active |
| US9753081B2 | Muxing interface platform for multiplexed handlers to reduce index time system and method | Physics | 0 | Active |
| US10422828B2 | Method and system for utilizing stand-alone controller in multiplexed handler test cell for indexless tandem semiconductor test | Physics | 0 | Active |
| US11448688B2 | Method for continuous tester operation during long soak time testing | Physics | 0 | Active |
| US10386405B2 | Method for continuous tester operation during multiple stage temperature testing | Physics | 0 | Active |
| US12360162B2 | Method for semiconductor device interface circuitry functionality and compliance testing | Physics | 0 | Active |
| US10197622B2 | Modular multiplexing interface assembly for reducing semiconductor testing index time | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.