Patent · US Active

Method for making nano-scaled channels with nanowires as masks

US10424479B2 · kind B2 · utility

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Key dates

Filing dateDec 22, 2017
Grant dateSep 24, 2019
Priority date
Expiry dateDec 22, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10K85/221
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of making nano-scaled channel, the method including: locating a first photoresist layer, a nanowire structure, and a second photoresist layer on a surface of a substrate, and the nanowire structure being sandwiched between the first photoresist layer and the second photoresist layer, wherein the nanowire structure comprises an nanowire; forming an opening in the first photoresist layer and the second photoresist layer to expose a portion of the surface of the substrate to form an exposed surface, wherein a part of the nanowire is exposed and suspended in the opening, and both ends of the nanowire are sandwiched between the first photoresist layer and the second photoresist layer; and depositing a thin film layer on the exposed surface of the substrate using the a nanowire as a mask, wherein the thin film layer defines a nano-scaled channel corresponding to the at least one nanowire.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.