Patent · US Active

Contact-via chain as corrosion detector

US10431507B2 · kind B2 · utility

0Cited by
1References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 9, 2016
Grant dateOct 1, 2019
Priority date
Expiry dateMay 9, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L23/585
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A detector for determining a faulty semiconductor component including a semiconductor component, a contact-via chain, which is situated laterally at a distance from the semiconductor component and which surrounds the semiconductor component in regions, a guard ring, which is situated laterally at a distance from the semiconductor component, and an evaluation unit, which is situated on the semiconductor component, wherein the evaluation unit is designed to apply an electrical voltage to the contact-via chain, in particular a permanent electrical voltage, to detect a resistance value of the contact-via chain and to produce an output signal when the resistance value of the contact-via chain exceeds a threshold value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.