Contact-via chain as corrosion detector
US10431507B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 2016 |
| Grant date | Oct 1, 2019 |
| Priority date | — |
| Expiry date | May 9, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L23/585
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A detector for determining a faulty semiconductor component including a semiconductor component, a contact-via chain, which is situated laterally at a distance from the semiconductor component and which surrounds the semiconductor component in regions, a guard ring, which is situated laterally at a distance from the semiconductor component, and an evaluation unit, which is situated on the semiconductor component, wherein the evaluation unit is designed to apply an electrical voltage to the contact-via chain, in particular a permanent electrical voltage, to detect a resistance value of the contact-via chain and to produce an output signal when the resistance value of the contact-via chain exceeds a threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.