Staggered word line architecture for reduced disturb in 3-dimensional NOR memory arrays

US10431596B2 · kind B2 · utility

Assignee

• SUNRISE MEMORY CORPORATION · US

Inventors

• Scott Brad Herner · Lafayette, US
• Eli Harari · Saratoga, US

Key dates

• Filing date: Aug 27, 2018
• Grant date: Oct 1, 2019
• Expiry date: Aug 27, 2038

Classification

• Technology area (CPC H): Electricity
• CPC primary: H10D30/691

Abstract

A staggered memory cell architecture staggers memory cells on opposite sides of a shared bit line preserves memory cell density, while increasing the distance between such memory cells, thereby reducing the possibility of a disturb. In one implementation, the memory cells along a first side of a shared bit line are connected to a set of global word lines provided underneath the memory structure, while the memory cells on the other side of the shared bit line—which are staggered relative to the memory cells on the first side—are connected to global word lines above the memory structure.