Two-dimensional X-ray detector position calibration and correction with diffraction pattern
US10444169B2 · kind B2 · utility
Inventor
Key dates
| Filing date | May 24, 2016 |
| Grant date | Oct 15, 2019 |
| Priority date | — |
| Expiry date | Jun 2, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/501
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining the spatial orientation of a two-dimensional detector in an X-ray diffractometry system, and calibrating the detector position in response thereto, uses diffraction patterns from a powder sample collected at a plurality of detector swing angles. The overlapping of the detected patterns indicates relative errors in the detector orientation. In particular, intersection points between the different diffraction patterns may be located, and their relative locations may be used to identify errors. Such errors may be in the detector position, or they may be errors in different rotational directions, such as roll, pitch or yaw. Determination and correction of the detector orientation using this method may be part of a calibration routine for the diffractometry system. Roll error may also be determined using a single measurement with the detector at a swing angle perpendicular to the X-ray beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.