Inline metrology on air flotation for PCB applications
US10458778B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2017 |
| Grant date | Oct 29, 2019 |
| Priority date | — |
| Expiry date | Nov 17, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K3/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system measures various PCB panel characteristics, such as PCB panel thickness, surface feature thickness (height), surface feature width and length, and warpage. Various techniques are also described for steadying the PCB panel for measurement, whether the PCB panel is positioned horizontally or vertically. Z-height measurements as well as light intensity measurements can be used to determine the various PCB panel characteristics. Either the determined light intensity values, the determined Z-height values, or both can be used to determine pixel transition from one region, or material type, to another. Techniques are also provided to reduce PCB panel vibration and/or automatically adjusting a Z-height of the sensor to ensure a sampling point on the PCB panel is within an allowable Z-height range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.