Patent · US Active

Probe card

US10459007B2 · kind B2 · utility

0Cited by

0References

5Claims

0Family size

Assignee

VIA Technologies, Inc. · TW

Inventors

Chen-Yueh Kung · New Taipei, TW
Wen-Yuan Chang · Taipei, TW
Wei-Cheng Chen · Tianjin, CN

Key dates

Filing date	Dec 17, 2018
Grant date	Oct 29, 2019
Priority date	—
Expiry date	Dec 17, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/07378
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe card including a circuit board, a transformer, a probe head, and a reinforcement structure is provided. The transformer including a body, a plurality of solder balls, and a plurality of first contact points are disposed on the substrate. The body has a first surface and a second surface, wherein the first surface is located between the circuit board and the second surface. The solder balls are disposed on the first surface, and the first contact points are disposed on the second surface. The probe head is disposed on the second surface. The probe head is electrically connected to the circuit board by the first solder balls. The reinforcement structure is disposed between the probe head and the circuit board.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.