Patent · US Active

Memory cell and methods thereof

US10460788B2 · kind B2 · utility

20Cited by
5References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 27, 2017
Grant dateOct 29, 2019
Priority date
Expiry dateOct 27, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/201
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

According to various embodiments, a memory cell may include: a channel region, a gate isolation structure disposed at the channel region; and a memory structure disposed over the gate isolation structure, the memory structure comprising a first electrode structure, a second electrode structure, and at least one remanent-polarizable layer disposed between the first electrode structure and the second electrode structure; wherein the first electrode structure, the gate isolation structure, and the channel region form a first capacitor structure defining a capacitor area of a first size; and wherein the first electrode structure, the at least one remanent-polarizable layer, and the second electrode structure form a second capacitor structure defining a capacitor area of a second size, wherein the second size is less than the first size.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.