X-ray interrogation system using multiple x-ray beams
US10466185B2 · kind B2 · utility
20Cited by
276References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 14, 2019 |
| Grant date | Nov 5, 2019 |
| Priority date | — |
| Expiry date | Feb 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/2204
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray interrogation system having one or more x-ray beams interrogates an object (i.e., object). A structured source producing an array of x-ray micro-sources can be imaged onto the object. Each of the one or more beams may have a high resolution, such as for example a diameter of about 15 microns or less, at the surface of the object. The illuminating one or more micro-beams can be high resolution in one dimension and/or two dimensions, and can be directed at the object to illuminate the object. The incident beam that illuminates the object has an energy that is greater than the x-ray fluorescence energy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.