Patent · US Active

Methods and apparatus for test insertion points

US10473717B2 · kind B2 · utility

0Cited by
8References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 9, 2016
Grant dateNov 12, 2019
Priority date—
Expiry dateDec 21, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318385
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Described examples include a method of providing K bits of test data to a combinatorial circuit. The method further includes generating N bits of test data using the combinatorial circuit, where N is greater than K. The method further includes providing the N bits of test data to a module under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.