Patent · US Active

Resistive memory and resistance window recovery method of resistive memory cell thereof

US10475513B2 · kind B2 · utility

1Cited by
6References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 5, 2018
Grant dateNov 12, 2019
Priority date
Expiry dateJun 5, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N70/8836
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A resistive memory and a resistance window recovery method for a resistive memory cell thereof are provided. During a first period, an over reset voltage difference is applied between a top electrode and a bottom electrode of the resistive memory cell, wherein the over reset voltage difference falls in a reset complementary switching (reset-CS) voltage range of the resistive memory cell. During a second period, a set voltage difference is applied between the top electrode and the bottom electrode of the resistive memory cell to increase a compliance current of the resistive memory cell. During a third period, a reset operation is performed on the resistive memory cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.