Spectrometer with two-dimensional spectrum

US10488254B2 · kind B2 · utility

Assignee

• Analytik Jena GmbH · DE

Inventors

• Stefan Münch · Oak Park, US
• Michael Okruss · Potsdam, DE

Key dates

• Filing date: Dec 20, 2016
• Grant date: Nov 26, 2019
• Expiry date: Dec 20, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2003/1828
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A spectrometer arrangement with two-dimensional spectrum, comprising a first dispersing element for spectral separation of radiation in a main dispersion direction, an imaging optics for imaging the radiation entering into the spectrometer arrangement through an entrance slit in an image plane for producing a two-dimensional spectrum, and a detector array with a two-dimensional arrangement of a plurality of detector elements in the image plane, wherein a reflector, a refractor, and/or a lens array are arranged in the beam path at a location where the dispersed, monochromatic beams are separated from one another, and the reflector, the refractor, and/or the lens array have a surface in the form of a freeform surface, such that area occupied by selected images of the entrance slit in the case of different wavelengths in the image plane is optimized over a selected spectral region of the two-dimensional spectrum.