Michael Okruss
11Patents
3h-index
6Co-inventors
49Inventor score
Filing activity: Nov 3, 2001 → May 21, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7876435B2 | Method for determining background and correction of broadband background | Physics | 28 | Active |
| US7804593B2 | Echelle spectometer with improved use of the detector by means of two spectrometer arrangements | Physics | 4 | Active |
| US7319519B2 | Method for the analysis of echelle spectra | Physics | 3 | Expired |
| US6717670B2 | High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile | Physics | 1 | Expired |
| US10746598B2 | Spectrometer arrangement | Physics | 0 | Active |
| US10718666B2 | Spectrometer arrangement, method for producing a two-dimensional spectrum by means of such a spectrometer arrangement | Physics | 0 | Active |
| US8681329B2 | Echelle spectrometer arrangement using internal predispersion | Physics | 0 | Active |
| US8873048B2 | Spectrometer arrangement | Physics | 0 | Active |
| US11204277B2 | Spectrometer arrangement | Physics | 0 | Active |
| US8102527B2 | Spectrometer assembly | Physics | 0 | Active |
| US10488254B2 | Spectrometer with two-dimensional spectrum | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.