Negative path testing in a bootloader environment
US10489258B2 · kind B2 · utility
0Cited by
1References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2017 |
| Grant date | Nov 26, 2019 |
| Priority date | — |
| Expiry date | Jan 16, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3065
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Negative path testing in a bootloader environment can include backing up a global state of a component under test, injecting a fault to trigger an error in the component under test in a bootloader environment, executing error handling instructions until a checkpoint of the component under test in the bootloader environment is reached, restoring the global state to the component under test from the backup, and restarting the component under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.