Smart box for automatic feature testing of smart phones and other devices
US10491314B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2015 |
| Grant date | Nov 26, 2019 |
| Priority date | — |
| Expiry date | Sep 24, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W84/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to and operable to stress a smart device in an enclosure, wherein the enclosure comprises a plurality of components, and wherein the system controller comprises: (a) a memory comprising test logic; and (b) a processor configured to automatically control the plurality of components and test the smart device in accordance with the test logic. Further, the plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto, wherein the stylus is operable to manipulate the smart device; and (b) a platform comprising a device holder affixed thereto, wherein the device holder is operable to receive the smart device, and wherein the platform and the robotic arm are robotically controlled to move by the processor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.