Ira Leventhal
25Patents
4h-index
36Co-inventors
59Inventor score
Filing activity: Dec 13, 2009 → Sep 30, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9948411B2 | Smart box for automatic feature testing of smart phones and other devices | Electricity | 11 | Active |
| US10020899B2 | Smart box for automatic feature testing of smart phones and other devices | Electricity | 9 | Active |
| US10158552B2 | Device profile-driven automation for cell-based test systems | Electricity | 5 | Active |
| US10171184B2 | Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device | Electricity | 5 | Active |
| US10548033B2 | Local portable test systems and methods | Electricity | 4 | Active |
| US10491314B2 | Smart box for automatic feature testing of smart phones and other devices | Electricity | 4 | Active |
| US10251079B2 | Cloud-based services for management of cell-based test systems | Electricity | 3 | Active |
| US11587640B2 | Carrier based high volume system level testing of devices with pop structures | Physics | 3 | Active |
| US9335347B2 | Method and apparatus for massively parallel multi-wafer test | Physics | 2 | Active |
| US11821913B2 | Shielded socket and carrier for high-volume test of semiconductor devices | Physics | 2 | Active |
| US10681570B2 | Automated configurable portable test systems and methods | Electricity | 1 | Active |
| US9606183B2 | Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test | Physics | 1 | Active |
| US10432328B2 | Smart box for automatic feature testing of smart phones and other devices | Electricity | 1 | Active |
| US11742055B2 | Carrier based high volume system level testing of devices with pop structures | Physics | 1 | Active |
| US10530499B2 | Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device | Electricity | 1 | Active |
| US11940487B2 | Thermal solution for massively parallel testing | Physics | 0 | Active |
| US10701571B2 | Automated validation and calibration portable test systems and methods | Electricity | 0 | Active |
| US8091810B2 | Cheese crumbling device | Human Necessities | 0 | Active |
| US12320852B2 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Physics | 0 | Active |
| US12203958B2 | Shielded socket and carrier for high-volume test of semiconductor devices | Physics | 0 | Active |
| US12374420B2 | Carrier based high volume system level testing of devices with pop structures | Physics | 0 | Active |
| US11549981B2 | Thermal solution for massively parallel testing | Physics | 0 | Active |
| US12007428B2 | Systems and methods for multidimensional dynamic part average testing | Physics | 0 | Active |
| US11808812B2 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Physics | 0 | Active |
| US11244443B2 | Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.