Methods, devices and systems for scanning tunneling microscopy control system design
US10495665B2 · kind B2 · utility
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29Claims
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Key dates
| Filing date | Sep 18, 2017 |
| Grant date | Dec 3, 2019 |
| Priority date | — |
| Expiry date | Jan 8, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/45182
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.